Scanning Transmission Electron Microscope
STEM
<Back to Last Page> <Glossary Home> <Random Word>
<Preface> <Suggest a
Word> <CRC Press Catalog>
<Abbreviations/Acronyms> <Symbols>
| A
| B
| C
| D
| E
| F
| G
| H
| I
| J
| K
| L
| M
| N
| O
| P
| Q
| R
| S
| T
| U
| V
| W
| X
| Y
| Z
| Newsletters
|
 |
| Stay
up-to-date! |
| Subscribe to newsletters |
|
| |
| |
|
Definition:
Technique for analysis of replicates of polished composite cross-sections as well as ion beam thinned composite sections. This method allows the determination of assemblages and microchemical composition of the matrix and fiber/matrix interfacial regions to a fine degree of spatial resolution.
Definition Copyright ©1989 CRC Press LLC. All rights
reserved.
<Back to Last Page> <Glossary Home> <Random Word>
<Preface> <Suggest a
Word> <CRC Press Catalog>
<Abbreviations/Acronyms> <Symbols>
| A
| B
| C
| D
| E
| F
| G
| H
| I
| J
| K
| L
| M
| N
| O
| P
| Q
| R
| S
| T
| U
| V
| W
| X
| Y
| Z
